BS EN 60749-21-2005 半导体器件.机械和气候试验方法.软钎焊性
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【英文标准名称】:Semiconductordevices-Mechanicalandclimatictestmethods-Solderability
【原文标准名称】:半导体器件.机械和气候试验方法.软钎焊性
【标准号】:BSEN60749-21-2005
【标准状态】:作废
【国别】:英国
【发布日期】:2005-12-05
【实施或试行日期】:2005-12-05
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:温度变化;气候;气候试验;部件;尺寸;电气工程;电学测量;电子工程;电子设备和元件;环境;环境测试;杂质;集成电路;机械测试;耐力;半导体器件;半导体;模拟;表面安装设备;软钎焊性;钎焊;表面安装;温度;测试;外观检查(测试)
【英文主题词】:Changesoftemperature;Climate;Climatictests;Components;Dimensions;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Environment;Environmentaltesting;Environmentaltests;Impurities;Integratedcircuits;Mechanicaltesting;Resistance;Semiconductordevices;Semiconductors;Simulation;SMD;Solderability;Solderings;Surfacemounting;Temperature;Testing;Visualinspection(testing)
【摘要】:ThispartofIEC60749establishesastandardprocedurefordeterminingthesolderabilityofdevicepackageterminationsthatareintendedtobejoinedtoanothersurfaceusingtin-lead(SnPb)orlead-free(Pb-free)solderfortheattachment.Thistestmethodprovidesaprocedurefor‘dipandlook’solderabilitytestingofthroughhole,axialandsurfacemountdevices(SMDs)aswellasanoptionalprocedureforaboardmountingsolderabilitytestforSMDsforthepurposeofallowingsimulationofthesolderingprocesstobeusedinthedeviceapplication.Thetestmethodalsoprovidesoptionalconditionsforageing.Thistestisconsidereddestructiveunlessotherwisedetailedintherelevantspecification.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:24P.;A4
【正文语种】:英语
【英文标准名称】:Machinetools;Multi-spindleheads;SleevesTypeA
【原文标准名称】:机床.多轴头.A型套
【标准号】:DIN69001-50-1981
【标准状态】:现行
【国别】:德国
【发布日期】:1981-10
【实施或试行日期】:
【发布单位】:德国标准化学会(DIN)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:轴头;尺寸;机床
【英文主题词】:machinetools;dimensions;spindlenoses
【摘要】:Machinetools;multi-spindleheads;distancesleevesformA
【中国标准分类号】:J51
【国际标准分类号】:25_060_20
【页数】:1P;A4
【正文语种】:德语
Product Code:SAE J1113/3
Title:Conducted Immunity, 250 Khz to 5000 Mhz, Direct Injection of Radio Frequency (Rf) Power
Issuing Committee:Electromagnetic Compatibility (Emc) Standards
Scope:This part of SAE J1113 specifies the direct RF power injection test method and procedure to testing electromagnetic immunity of electronic components for passenger cars and commercial vehicles. The electromagnetic disturbances considered in this part of SAE J1113 are limited to continuous, narrowband conducted RF energy.This test method is applicable to all DUT leads except ground. The test provides differential mode excitation to the DUT.Immunity measurements of complete vehicles are generally only possible by the vehicle manufacturer. The reasons, for example, are high costs of a large absorber-lined chamber, preserving the secrecy of prototypes or the large number of different vehicle models. Therefore, for research, development, and quality control, a laboratory measuring method for components shall be applied by the manufacturer. This method is suitable over the frequency range of 250 kHz to 500 MHz.